Junquan Shen
Current Organizations / Institutes
The organizations/institutes from the scholar's latest article
Research Subjects
Research Interests
Junquan Shen has a total of 6 co-authors. Here are the top co-authors by number of shared publications:
- Cheng-Yi Wu
TXC (Ningbo) Corporation, Ningbo 315800, China
1 shared publication - Chin-Yin Chen
Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, China
1 shared publication - Congda Lu
College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou 310014, China
1 shared publication - Jiguang Cheng
TXC (Ningbo) Corporation, Ningbo 315800, China
1 shared publication - Min-Chiang Chao
TXC (Ningbo) Corporation, Ningbo 315800, China
1 shared publication - Qiang Zhou
TXC (Ningbo) Corporation, Ningbo 315800, China
1 shared publication
Latest Publications
- Open Access
The Force–Frequency Characteristics of Quartz Wafers under a Cantilever Beam Structure
This study investigated the force–frequency characteristics of quartz wafers inside a cantilever beam frame. Firstly, the force–frequency coefficient formula of quartz wafers with fixed ends under axial force was analyzed. Firstly, the formula for the force–frequency coefficient of quartz wafers with fixed ends under axial force was analyzed. A force–frequency coefficient formula suitable for cantilever beam structures was derived by considering the changes in surface stress and stiffness of quartz wafers with fixed ends and one end under force on the other. Subsequently, the formula’s accuracy was verified by experiments, and the accuracy was more than 92%. In addition, strain simulation analysis was performed on three different shapes of quartz wafers, and experimental verification was carried out on two of them. The results revealed that trapezoidal quartz wafers and cantilever beam structures exhibited superior stress distribution to rectangular chips. Furthermore, by positioning electrodes at various locations on the surface of the quartz chip, it was observed that, as the electrodes moved closer to the fixed end, the force–frequency coefficient of the rectangular quartz chip increased, along with an increase in chip strain under the cantilever structure. In summary, this study provides a new approach for designing cantilever quartz resonator sensors in the future.
Open AccessThe Force–Frequency Characteristics of Quartz Wafers under a Cantilever Beam Structure
This study investigated the force–frequency characteristics of quartz wafers inside a cantilever beam frame. Firstly, the force–frequency coefficient formula of quartz wafers with fixed ends under axial force was analyzed. Firstly, the formula for the force–frequency coefficient of quartz wafers with fixed ends under axial force was analyzed. A force–frequency coefficient formula suitable for cantilever beam structures was derived by considering the changes in surface stress and stiffness of quartz wafers with fixed ends and one end under force on the other. Subsequently, the formula’s accuracy was verified by experiments, and the accuracy was more than 92%. In addition, strain simulation analysis was performed on three different shapes of quartz wafers, and experimental verification was carried out on two of them. The results revealed that trapezoidal quartz wafers and cantilever beam structures exhibited superior stress distribution to rectangular chips. Furthermore, by positioning electrodes at various locations on the surface of the quartz chip, it was observed that, as the electrodes moved closer to the fixed end, the force–frequency coefficient of the rectangular quartz chip increased, along with an increase in chip strain under the cantilever structure. In summary, this study provides a new approach for designing cantilever quartz resonator sensors in the future.