Transformer Based Line Segment Classifier with Image Context for Real-Time Vanishing Point Detection in Manhattan World
Authors:
- 1 June 2022
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 6083-6092
Abstract
Previous works on vanishing point detection usually use geometric prior for line segment clustering. We find that image context can also contribute to accurate line classification. Based on this observation, we propose to classify line segments into three groups according to three unknown-but-sought vanishing points with Manhattan world assumption, using both geometric information and image context in this work. To achieve this goal, we propose a novel Transformer based Line segment Classifier (TLC) that can group line segments in images and estimate the corresponding vanishing points. In TLC, we design a line segment descriptor to represent line segments using their positions, directions and local image contexts. Transformer based feature fusion module is used to capture global features from all line segments, which is proved to improve the classification performance significantly in our experiments. By using a network to score line segments for outlier rejection, vanishing points can be got by Singular Value Decomposition (SVD) from the classified lines. The proposed method runs at 25 fps on one NVIDIA 2080Ti card for vanishing point detection. Experimental results on synthetic and real-world datasets demonstrate that our method is superior to other state-of-the-art methods on the balance between accuracy and efficiency, while keeping stronger generalization capability when trained and evaluated on different datasets.Keywords
Funding Information
- NNSFC (61971008)
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