SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging
- 22 July 2022
- journal article
- abstracts
- Published by Oxford University Press (OUP) in Microscopy and Microanalysis
- Vol. 28 (S1) , 30-31
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscopeReports on Progress in Physics, 2021
- Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imagingMicroscopy and Microanalysis, 2021
- 4D Surface Reconstructions to Study Microscale Structures and Functions in Soil BiogeochemistryEnvironmental Science & Technology, 2021
- High Resolution Multimodal Chemical Imaging Platform for Organics and InorganicsAnalytical Chemistry, 2019
- Imaging and Analytics on the Helium Ion MicroscopeAnnual Review of Analytical Chemistry, 2019
- Correlative Microscopy in 3D: Helium Ion Microscopy-Based Photogrammetric Topography Reconstruction Combined with in situ Secondary Ion Mass SpectrometryAnalytical Chemistry, 2018
- Cold atomic beam ion source for focused ion beam applicationsJournal of Applied Physics, 2013