Effect of additional sample bias in Meshed Plasma Immersion Ion Deposition (MPIID) on microstructural, surface and mechanical properties of Si-DLC films

Authors:
  • MWMingzhong Wu
    Mingzhong Wu
  • XTXiubo Tian
    Xiubo Tian
  • MLMuqin Li
    Muqin Li
  • CGChunzhi Gong
    Chunzhi Gong
  • RWRonghua Wei
    Ronghua Wei

Abstract
No abstract available
Funding Information
  • National Natural Science Foundation of China (51175118, U1330110)
  • State Key Laboratory of Advanced Welding & Joining, Harbin Institute of Technology (AWPT-Z02)

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