Design sensitivities to variability: extrapolations and assessments in nanometer VLSI
Authors:
- Y. CaoYCY. Cao
- P. GuptaPGP. Gupta
- A.B. KahngAKA.B. Kahng
- D. SylvesterDSD. Sylvester
- J. YangJYJ. Yang
- 27 August 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 411-415
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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