Studies on metal film growth through instantaneously observed attenuated total reflection spectra
Authors:
- M. FukuiMFM. Fukui
- K. OdaKOK. Oda
- 1 September 1988
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 33-34, 882-889
Abstract
No abstract availableFunding Information
- Ministry of Education
This publication has 6 references indexed in Scilit:
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- High Precision Scanning EllipsometerApplied Optics, 1975
- Effects of Optical Anisotropy of Aggregated Silver Films on Ellipsometric Determination of n, k, and dJournal of the Optical Society of America, 1972