Imaging surface topography with coherent x-ray reflectivity: Theory, kinematics, and simulations
Open Access
- 6 February 2026
- journal article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 113 (7)
Abstract
A theoretical formalism is described for understanding coherent x-ray reflectivity (CXR) from the surface of a semi-infinite crystal having a variable surface topography, described by the height profile h ( x , y ). The surface topography is imaged as a complex “effective density,” obtained from the phasing and inversion of the coherent x-ray reflectivity data, measured through a rocking scan centered at a vertical momentum transfer Q z 0 and a vertical range Δ Q z . The formalism predicts that the effective density has an amplitude with a maximum located at the surface height for each position within the surface plane. The phase of the effective density has a lateral variation that is controlled by the surface height and a vertical variation that reflects a combination of the interfacial structure and specific choice of measurement conditions. This understanding enables direct observation of nanometer-scale interfacial topography, i.e., h ( x , y ) c s (where c s is the vertical substrate lattice parameter) with Å -scale sensitivity to surface height. Numerical simulations illustrate and confirm the theoretical results. These results show how the interpretation of the interfacial density phase obtained by CXR data inversion (i.e., surface topography with respect to a flat surface) is conceptually similar to that previously known for Bragg coherent diffraction imaging (BCDI) measurements of isolated nanoparticles (i.e., lattice displacements with respect to an ideal crystal lattice). This suggests that CXR can be thought of as a form of dark field imaging with respect to the bright field BCDI approach. An implication of these results is that interfacial imaging may bypass some of the significant challenges associated with BCDI imaging of multiple particles having different orientations.Keywords
Funding Information
- U.S. Department of Energy (DE-AC02-06CH11357)
- Office of Science
- Basic Energy Sciences
- Agencia Estatal de Investigación (PID2020-115159GB-I00/AEI/10.13039/501100011033)
- Federación Española de Enfermedades Raras
This publication has 45 references indexed in Scilit:
- Visualizing the Internal Nanocrystallinity of Calcite Due to Nonclassical Crystallization by 3D Coherent X‐Ray Diffraction ImagingAdvanced Materials, 2024
- Oxide– and Silicate–Water Interfaces and Their Roles in Technology and the EnvironmentChemical Reviews, 2023
- Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection PtychographyNano Letters, 2018
- Dark-field X-ray microscopy for multiscale structural characterizationNature Communications, 2015
- Coherent X-ray diffraction imaging of strain at the nanoscaleNature Materials, 2009
- Probe retrieval in ptychographic coherent diffractive imagingUltramicroscopy, 2009
- Hard-X-ray dark-field imaging using a grating interferometerNature Materials, 2008
- Observation of subnanometre-high surface topography with X-ray reflection phase-contrast microscopyNature Physics, 2006
- Three-dimensional mapping of a deformation field inside a nanocrystalNature, 2006
- Model-independent X-ray imaging of adsorbed cations at the crystal–water interfaceSurface Science, 2004