Simultaneous thickness and group index measurement using optical low-coherence reflectometry

Authors:

1 January 1992

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters

Vol. 4 (1) , 105-107
DOI:10.1109/68.124892

Abstract

Using high-resolution optical reflectometry, group index and physical thickness can both be determined by precisely measuring optical time delays through a sample. Optical low-coherence reflectometry offers both the high-spatial resolution and large dynamic range required to perform accurate measurements using this technique.

Keywords

This publication has 5 references indexed in Scilit:

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