Abstract
Results for analysing point defects in cubic crystals by diffuse X‐ray scattering as given in a previous paper are applied to small dislocation loops. The scattering pattern in the immediate vicinity of Bragg reflections is shown to indicate whether or not the crystal contains predominantly one of several high symmetry configurations. In the presence of dislocation loops with a lower symmetry or of a mixture of different configurations, average fractions of edge‐ and shear‐components can still be determined. The corresponding parameters also give information about the shape of defects in the case of other types of defect clusters.

This publication has 8 references indexed in Scilit: