Geometric artefact suppressed surface potential measurements
Authors:
- Minhwan LeeMLMinhwan Lee
- Wonyoung LeeWLWonyoung Lee
- Fritz B PrinzFPFritz B Prinz
- 30 June 2006
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 17 (15) , 3728-3733
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Quantitative analysis of electric force microscopy: The role of sample geometryReview of Scientific Instruments, 2005
- Kelvin Probe Force Microscopy Study on Conjugated Polymer/Fullerene Bulk Heterojunction Organic Solar CellsNano Letters, 2005
- Relationship between charge distribution and its image by electrostatic force microscopyJournal of Applied Physics, 2003
- Models for quantitative charge imaging by atomic force microscopyJournal of Applied Physics, 2001
- Localized charge injection in SiO2 films containing silicon nanocrystalsApplied Physics Letters, 2001
- Simulation and correction of geometric distortions in scanning Kelvin probe microscopyJournal of Vacuum Science & Technology A, 2000
- Charge, Polarizability, and Photoionization of Single Semiconductor NanocrystalsPhysical Review Letters, 1999
- High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopyApplied Physics Letters, 1999
- Charge storage in Co nanoclusters embedded in SiO2 by scanning force microscopyApplied Physics Letters, 1999
- Kelvin probe force microscopyApplied Physics Letters, 1991