Design and Characterization of an ODMR System for NV-Based Quantum Sensing

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Abstract
This paper presents the development of a confocal Optically Detected Magnetic Resonance (ODMR) system to study diamond and Silicon Carbide (SiC) for reactor dosimetry and quantum defect analysis. Initially, Nitrogen-Vacancy (NV) centers in diamond were characterized to establish a performance baseline, followed by plans to map and quantify color center populations in SiC crystals before and after alpha and neutron irradiation. By correlating ODMR data with electrical performance metrics, we aim to optimize fabrication and annealing protocols to investigate fast neutron sensitivity. The ODMR system, integrated with a home-built confocal microscopy setup, includes a microwave antenna, magnet, laser, objective, and advanced measurement devices such as Si-APD and Time Tagger 20 for high-resolution T2* and T2 measurements. The characterization of the instrument includes high-resolution fluorescence and ODMR spectra of NV centers in diamond, and improved resolution with confocal optics. Ongoing work focuses on correlating luminescence with reactor neutron fluence and the long-term goal is for the advancing SiC irradiation for integrated spin defect analysis.

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