Percolation of gallium dominates the electrical resistance of focused ion beam deposited metals
Authors:
- 28 April 2014
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 104 (17) , 173107
Abstract
Metal deposition through focused ion beam (FIB) based systems is thought to result in material composed of the primary metal from the metallo-organic precursor in addition to carbon, oxygen, and gallium. We determined, through electrical resistance and chemical composition measurements on a wide range of FIB deposited platinum and tungsten lines, that the gallium ion (Ga+) concentration in the metal lines plays the dominant role in controlling the electrical resistivity. Effective medium theory, based on McLachlan's formalisms, was used to describe the relationship between the Ga+ concentration and the corresponding resistivity.Keywords
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