A new probabilistic relaxation scheme and its application to edge detection
Authors:
- Weian DengWDWeian Deng
- S.S. IyengarSIS.S. Iyengar
- 1 April 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Pattern Analysis and Machine Intelligence
- Vol. 18 (4) , 432-437
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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