SDDiff: Semi-supervised surface defect detection with Diffusion Probabilistic Model
Authors:
- Xubin WangXWXubin Wang
- Wenju LiWenju Li
- Liu CuiLCLiu Cui
- Ningkang OuyangNONingkang Ouyang
- 14 July 2024
- journal article
- research article
- Published by Elsevier in Measurement
- Vol. 238
Abstract
No abstract availableKeywords
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