Reveling the Structural, Electric, and High-Frequency Dielectric Properties of Residue Doped-CaWO4 Flexible Multilayer Ceramic Sheets

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Abstract
The mineralization process to reach Tungsten (W) involves several steps to reduce the impurities (residues), which makes the process more expensive. However, it is possible to explore the pure scheelite (CaWO4) and residue doped-CaWO4 on flexible sheets using the Tape Casting technique. In particular, the high frequency dielectric properties of flexible multilayers have an increased appeal in the electronics industry. In this study, we present a systematic investigation of structural, morphological, electrical and high-frequency dielectric properties of flexible ceramics sheet multilayers composed of pure CaWO4 and residue-doped CaWO4. Our findings demonstrate that the dielectric constant has a small dependence on the residue amount, but a remarkable modification in the dielectric constant as the number of layers increases. Here we achieved a 34% increase in the dielectric constant for pure CaWO4 flexible ceramic sheets when the number of layers increased from 1 to 3.
Funding Information
  • CNPq (406836/2022-1)

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