TEM investigation of interfacial microstructure and fracture mode of the Sn-Ag-Cu/Ni joint system

Authors:
  • CHC.E. Ho
    C.E. Ho
  • MLM.K. Lu
    M.K. Lu
  • PLP.T. Lee
    P.T. Lee
  • YHY.H. Huang
    Y.H. Huang
  • WCW.L. Chou
    W.L. Chou

Abstract
No abstract available
Funding Information
  • Ministry of Science and Technology (MOST105-2628-E-155-001-MY3, MOST105-2221-E-155-006-MY2, and MOST106-2622-E-155-006-CC3)

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