Transmission Electron Microscopy and X-ray Diffraction Investigation of the Microstructure of Nanoscale Multilayer TiAlN/VN Grown by Unbalanced Magnetron Deposition
- 1 April 2004
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 19 (4) , 1093-1104
Abstract
No abstract availableKeywords
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