Cross-Section Analysis of a Laminated Film by Dual FIB ToF-SIMS
Authors:
Open Access
- 1 January 2011
- journal article
- Published by Surface Science Society Japan in e-Journal of Surface Science and Nanotechnology
- Vol. 9, 426-429
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
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- Structural Analysis of Coal Fly Ash Particles by means of Focused-Ion-Beam Time-of-Flight Mass Spectrometrye-Journal of Surface Science and Nanotechnology, 2004
- Quantitative analysis by submicron secondary ion mass spectrometryJournal of Vacuum Science & Technology B, 1988