X-Ray Diffraction Profile Analysis for the Determination of the Crystal Structure of BaTiO3
Authors:
- Masahiro TanakaMTMasahiro Tanaka
- Hideshi FujishitaHFHideshi Fujishita
- Yōichi ShiozakiYSYōichi Shiozaki
- Etsuro SawaguchiESEtsuro Sawaguchi
- 1 September 1980
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 19 (9)
Abstract
The profile analysis method is applied to the X-ray powder diffraction pattern of tetragonal BaTiO3; a Si specimen is also examined as an initial test of the method. The accuracy with Si is nearly the same as that of the standard single crystal method. The result for BaTiO3 powder proves that the X-ray profile analysis method is quite useful for the determination of structures, especially when no single crystals are available or the conventional single crystal method is unsatisfactory because of experimental difficulties.Keywords
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