Morphological study of the Al–Ti ohmic contact to p-type SiC
Authors:
- S.E. MohneySMS.E. Mohney
- B.A. HullBHB.A. Hull
- J.Y. LinJLJ.Y. Lin
- J. CroftonJCJ. Crofton
- 1 May 2002
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 46 (5) , 689-693
Abstract
No abstract availableKeywords
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