Measurement of toxic volatile organic compounds in indoor air of semiconductor foundries using multisorbent adsorption/thermal desorption coupled with gas chromatography–mass spectrometry
Authors:
- Ming-Nan LinMLMing-Nan Lin
- Chien-Tai FengCFChien-Tai Feng
- Kuang-Ling YangKYKuang-Ling Yang
- Yu-Shiu LoYLYu-Shiu Lo
- Jiunn-Guang LoJLJiunn-Guang Lo
- 1 May 2003
- journal article
- Published by Elsevier in Journal of Chromatography A
- Vol. 996 (1-2) , 225-231
Abstract
No abstract availableKeywords
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