Machine Learning Determination of the Twist Angle of Bilayer Graphene by Raman Spectroscopy: Implications for van der Waals Heterostructures
- 18 January 2022
- journal article
- research article
- Published by American Chemical Society (ACS) in ACS Applied Nano Materials
- Vol. 5 (1) , 1356-1366
Abstract
No abstract availableKeywords
All Related Versions
Funding Information
- Core Research for Evolutional Science and Technology (JPMJCR18I1, JPMJCR20B1)
- Japan Society for the Promotion of Science (21H05232, 21H05233, 21K18878, JP18H03864, JP19K22113)
This publication has 53 references indexed in Scilit:
- Observation of Layer-Breathing Mode Vibrations in Few-Layer Graphene through Combination Raman ScatteringNano Letters, 2012
- Understanding and controlling the substrate effect on graphene electron-transfer chemistry via reactivity imprint lithographyNature Chemistry, 2012
- Angle-Resolved Raman Imaging of Interlayer Rotations and Interactions in Twisted Bilayer GrapheneNano Letters, 2012
- Optical separation of mechanical strain from charge doping in grapheneNature Communications, 2012
- Raman Signature of Graphene SuperlatticesNano Letters, 2011
- Raman Characterization of ABA- and ABC-Stacked Trilayer GrapheneACS Nano, 2011
- Second-Order Overtone and Combination Raman Modes of Graphene Layers in the Range of 1690−2150 cm−1ACS Nano, 2011
- Raman Scattering from High-Frequency Phonons in Supported n-Graphene Layer FilmsNano Letters, 2006
- Machine learning: a review of classification and combining techniquesArtificial Intelligence Review, 2006
- Estimating mutual informationPhysical Review E, 2004