Intensity–voltage low‐energy electron microscopy for functional materials characterization

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Abstract
Magnified image Dynamic I (V)‐LEEM, i.e., the continuous recording of low‐energy electron microscopy (LEEM) images upon cycling the electron kinetic energy, enables time‐resolved characterization of surface structure on the nanometer scale. When combined with state‐of‐the‐art theoretical calculations, detailed information on geometric and electronic structure as well as chemical composition can be gained. Here, we present a contemporary review of the experimental and theoretical methodology and provide a survey of the application of I (V)‐LEEM to the study of functional materials, particularly focusing on structural phenomena in oxide heteroepitaxy and chemical redox reactions. magnified image Time‐dependent intensity–voltage curves demonstrate the transformation from the (1 × 1)‐O adlayer phase to RuO2(110) during Ru(0001) oxidation on the nanometer scale.
Funding Information
  • Spanish Ministerio de Ciencia e Innovación (FIS2010-19609-C02-02)

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