Analysis and numerical design of Resistive AC-Coupled Silicon Detectors (RSD) for 4D particle tracking
Authors:
- M. MandurrinoMMM. Mandurrino
- R. ArcidiaconoRAR. Arcidiacono
- M. BoscardinMBM. Boscardin
- N. CartigliaNCN. Cartiglia
- G.-F. Dalla BettaGBG.-F. Dalla Betta
- M. FerreroMFM. Ferrero
- F. FicorellaFFF. Ficorella
- L. PancheriLPL. Pancheri
- G. PaternosterGPG. Paternoster
- F. SivieroFSF. Siviero
- V. SolaVSV. Sola
- A. StaianoASA. Staiano
- 1 April 2020
- journal article
- research article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 959
Abstract
No abstract availableKeywords
Funding Information
- CERN
- Instituto Nazionale di Fisica Nucleare (19105, 19567)
This publication has 16 references indexed in Scilit:
- 4D tracking with ultra-fast silicon detectorsReports on Progress in Physics, 2017
- Beam test results of a 16 ps timing system based on ultra-fast silicon detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2017
- Design optimization of ultra-fast silicon detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2015
- Investigations of donor and acceptor removal and long term annealing in silicon with different boron/phosphorus ratiosNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1996
- Threshold energy effect on avalanche breakdown voltage in semiconductor junctionsSolid-State Electronics, 1975
- Measurement of the ionization rates in diffused silicon p-n junctionsSolid-State Electronics, 1970
- Disordered Regions in Semiconductors Bombarded by Fast NeutronsJournal of Applied Physics, 1959
- Ionization Rates for Electrons and Holes in SiliconPhysical Review B, 1958
- Currents Induced by Electron MotionProceedings of the IRE, 1939
- Currents to Conductors Induced by a Moving Point ChargeJournal of Applied Physics, 1938