Intermediate valence in YbAl3 and EuCu2Si2 by X-ray Photoemission (XPS)
Authors:
- K.H.J. BuschowKBK.H.J. Buschow
- M. CampagnaMCM. Campagna
- G.K. WertheimGWG.K. Wertheim
- 31 October 1977
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 24 (3) , 253-256
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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