Polarization dependence of soft-x-ray Raman scattering at theLedge of
Authors:
- 15 May 2000
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 61 (19) , 12854-12859
Abstract
Polarization dependence of soft-x-ray Raman scattering was investigated at the Ti absorption edge of Strong Raman scattering feature appears about 14 eV below elastic peaks with strong polarization dependence. These Raman scattering structures are charge transfer excitations to the antibonding state between and states, because they are enhanced when the incident photon energies are tuned at satellite structures of Ti absorption spectrum. Broad Raman scattering structures are found between 3 eV and 10 eV below elastic peaks. They are assigned to be nonbonding type charge transfer excitations or interband transition from O valence to Ti conduction bands, which includes the crystal field splitting in symmetry with two Ti-O bond lengths.
Keywords
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