Precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler
Authors:
- 1 June 1997
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 36 (16) , 3769-3775
Abstract
A precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler (LTP) is presented. A maximum distortion of 0.47 µm across a length of 180 mm was measured for an internally water-cooled mirror on an undulator beam line at ELETTRA while exposed to a total emitted power of 600 W. This first successfully tested in situ distortion profile points out the importance and need for this method. Two configurations for performing in situ LTP tests are discussed. For this measurement the configuration with all the equipment external to the vacuum chamber was used. The experiment has an accuracy and a repeatability of 0.04 µm. Suggestions for improving the accuracy and stability are presented.Keywords
This publication has 8 references indexed in Scilit:
- The penta-prism LTP: A long-trace-profiler with stationary optical head and moving penta prisma)Review of Scientific Instruments, 1995
- Adaptive x-ray mirror prototype: First results (invited)Review of Scientific Instruments, 1995
- In situ surface profiler for high heat load mirror measurementOptical Engineering, 1995
- Thermal distortion test facilityOptical Engineering, 1995
- High heat load optics: an historical overviewOptical Engineering, 1995
- Determining surface profile from sequential interference patterns from a long tracer profilerReview of Scientific Instruments, 1992
- Using a straightness reference in obtaining more accurate surface profiles from a long trace profilerReview of Scientific Instruments, 1992
- Interferometry of wave fronts reflected off conical surfacesApplied Optics, 1983