Transient phenomena analysis using dynamic speckle patterns

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Abstract
The full width at half maximum (FWHM) is sometimes used to characterize the autocorrelation function of the time history of a speckle pattern. We propose to include more autocorrelation points to diminish the variability of the measurement. The width of the equivalent rectangle (WER) and the X*LOG X measurements are defined and some simulations and experimental results obtained are shown. © 1996 Society of Photo−Optical Instrumentation Engineers.