On-line diagnosis using Orthogonal Multi-Tone Time Domain Reflectometry in a lossy cable
- 1 March 2013
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1-6
Abstract
Currently, on-line wire diagnosis using reflectometry is under intensive investigation, aiming at detecting and locating faults on wiring networks while the target system is operating. The idea is to inject a broadband test signal in the network under test and analyse the signal reflected by each impedance discontinuity. However, the presence of native signals on live wires may impact the diagnosis due to interference and EMC or limited bandwidth constraints. Our proposed "Orthogonal MultiTone Time Domain Reflectometry"(OMTDR) method, based on Orthogonal Frequency Division Multiplexing (OFDM) technique, seems to be a suitable candidate for on-line diagnosis as it achieves high data rate transmission, interference robustness, bandwidth efficiency and complete spectrum control. Moreover, it allows communication among diagnosis sensors to accurately locate faults position in multi-branch wiring networks which require more than one diagnosis sensor.Keywords
This publication has 14 references indexed in Scilit:
- Reflectrometry based fault localization in automotive bus systems2012
- Broadband Reflectometry for Diagnostics and Monitoring ApplicationsIEEE Sensors Journal, 2010
- Distributed Reflectometry Method for Wire Fault Location Using Selective AverageIEEE Sensors Journal, 2009
- Filterbank Multicarrier Reflectometry for Cognitive Live Wire TestingIEEE Sensors Journal, 2009
- OFDM for Optical CommunicationsJournal of Lightwave Technology, 2009
- Multicarrier reflectometryIEEE Sensors Journal, 2006
- A critical comparison of reflectometry methods for location of wiring faultsSmart Structures and Systems, 2006
- Frequency-domain reflectometery for on-board testing of aging aircraft wiringIEEE Transactions on Electromagnetic Compatibility, 2003
- Down to the wire [aircraft wiring]IEEE Spectrum, 2001
- Conversions between S, Z, Y, H, ABCD, and T parameters which are valid for complex source and load impedancesIEEE Transactions on Microwave Theory and Techniques, 1994