Resonant inelastic soft x-ray scattering on LaPt2Si2

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Abstract
X-ray absorption and resonant inelastic x-ray scattering spectra of LaPt2Si2 single crystal at the Si 2p and La 4d edges are presented. The data are interpreted in terms of density functional theory, showing that the Si spectra can be described in terms of Si s and d local partial density of states (LPDOS), and the La spectra are due to quasi-atomic local 4f excitations. Calculations show that Pt d-LPDOS dominates the occupied states, and a sharp localized La f state is found in the unoccupied states, in line with the observations.
Funding Information
  • Swedish Research Council (2016-06955)
  • Stiftelsen för Strategisk Forskning (RIF14-0064)
  • Carl Tryggers Foundation for Scientific Research (CTS-18:272)
  • Chalmers University of Technology (Area of Advance - Material Sciences)

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