Machine learning pipeline for denoising low signal-to-noise ratio and out-of-distribution transmission electron microscopy datasets
Open Access
- 27 June 2026
- journal article
- research article
- Published by Springer Nature in npj Computational Materials
- Vol. 12 (1)
Abstract
High-resolution transmission electron microscopy (HRTEM) is crucial for observing material’s structural and morphological evolution at Angstrom scales, but the electron beam can alter these processes. Devices such as CMOS-based direct-electron detectors operating in electron-counting mode can be utilized to substantially reduce the electron dosage. However, the resulting images often lead to a low signal-to-noise ratio, which requires frame integration that sacrifices temporal resolution. Several machine learning (ML) models have been recently developed to successfully denoise HRTEM images. Yet, these models are often computationally expensive, and their inference speeds on GPUs are outpaced by the imaging speed of advanced detectors, precluding in situ analysis. Furthermore, the performance of these denoising models on datasets with imaging conditions that deviate from the training datasets has not been evaluated. To mitigate these gaps, we propose a new self-supervised ML denoising pipeline specifically designed for time-series HRTEM images. This pipeline integrates a blind-spot convolution neural network with pre-processing and post-processing steps, including drift correction and low-pass filtering. Results demonstrate that our model outperforms various other ML and non-ML denoising methods in noise reduction and contrast enhancement, leading to improved visual clarity of atomic features. Additionally, the model is drastically faster than U-Net-based ML models and demonstrates excellent out-of-distribution generalization. The model’s computational inference speed is in the order of milliseconds per image, rendering it suitable for application in in-situ HRTEM experiments.Keywords
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Funding Information
- U.S. Department of Energy (DE-SC0012704)
- U.S. Department of Energy (DE-SC0012704)
- U.S. Department of Energy (DE-SC0012704)
- U.S. Department of Energy (DE-SC0012704)
- U.S. Department of Energy (DE-SC0012704)
This publication has 44 references indexed in Scilit:
- Understanding the Dynamic Aggregation in Single‐Atom CatalysisAdvanced Science, 2024
- Uneven Oxidation and Surface Reconstructions on Stepped Cu(100) and Cu(110)Nano Letters, 2022
- Atomic Scale Characterization of Fluxional Cation Behavior on Nanoparticle Surfaces: Probing Oxygen Vacancy Creation/Annihilation at Surface SitesACS Nano, 2021
- Unpaired Learning of Deep Image Denoising2020
- Single Atom Dynamics in Chemical ReactionsAccounts of Chemical Research, 2020
- U-Net: Convolutional Networks for Biomedical Image Segmentation2015
- Influence of electron dose rate on electron counting images recorded with the K2 cameraJournal of Structural Biology, 2013
- Stacked Convolutional Auto-Encoders for Hierarchical Feature Extraction2011
- Enhanced imaging in low dose electron microscopy using electron countingUltramicroscopy, 2009
- A rad-hard CMOS active pixel sensor for electron microscopyNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2009