Exact ellipsometric measurement of thickness and optical properties of a thin light-absorbing film without auxiliary measurements
Authors:
- 30 November 1971
- journal article
- Published by Elsevier in Surface Science
- Vol. 28 (1) , 61-68
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Multiple-Angle-of-Incidence Ellipsometry of Very Thin Films*Journal of the Optical Society of America, 1971
- Ellipsometric-spectroscopy of films formed on metals in solutionSurface Science, 1969
- A high speed precision automatic ellipsometerSurface Science, 1969
- Electrochemical Ellipsometric Study of GoldJournal of the Electrochemical Society, 1969
- Ellipsometric Study of Oxygen-Containing Films on Platinum AnodesThe Journal of Chemical Physics, 1968
- Optical Measurement of Film Growth on Silicon and Germanium Surfaces in Room AirJournal of the Electrochemical Society, 1957
- Optical methods of studying films on reflecting bases depending on polarisation and interference phenomenaTransactions of the Faraday Society, 1946