X-ray Reflectivity Study of Ultrathin Liquid Films of Diphenylsiloxane−Dimethylsiloxane Copolymers

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Abstract
Using X-ray reflectivity, we observe drastic differences in the interfacial structure and molecular ordering of diphenylsiloxane−dimethylsiloxane copolymer thin films deposited on hydroxylated versus H-terminated (etched) silicon wafers. We find that substrate type and comonomer ratio determine the conformational arrangements in these liquid films. High-energy bonding between the substrate and the molecules and an increase in rigidity of the molecules due to replacement of methyl groups by phenyl groups leads to a specific molecular ordering at the liquid/solid interface and pronounced density oscillations in this region. The observed structural reorganizations are explained by the interplay and the established balance between the chain flexibility and the polymer−substrate interactions.

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