Characterization of crystallographic defects in homoepitaxial diamond films by synchrotron X-ray topography and cathodoluminescence
Authors:
- Hitoshi UmezawaHUHitoshi Umezawa
- Yukako KatoYKYukako Kato
- Hideyuki WatanabeHWHideyuki Watanabe
- Ashraf M.M. OmerAOAshraf M.M. Omer
- Hirotaka YamaguchiHYHirotaka Yamaguchi
- Shin-Ichi ShikataSSShin-Ichi Shikata
- 1 April 2011
- journal article
- Published by Elsevier in Diamond and Related Materials
- Vol. 20 (4) , 523-526
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
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