Test scheduling in high performance VLSI system implementations

Authors:

JSJ.Y. Sayah
J.Y. Sayah
CKC.R. Kime
C.R. Kime

Publisher website

1 January 1992

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. 41 (1) , 52-67
DOI:10.1109/12.123376

Abstract

No abstract available

Keywords

This publication has 6 references indexed in Scilit:

Test scheduling and control for VLSI built-in self-test
IEEE Transactions on Computers, 1988
Design And Test of the 80386
IEEE Design & Test of Computers, 1987
Test Schedules for VLSI Circuits Having Built-In Test Hardware
IEEE Transactions on Computers, 1986
MicroNews
IEEE Micro, 1986
Design for testability—A survey
Proceedings of the IEEE, 1983
Built-in test for complex digital integrated circuits
IEEE Journal of Solid-State Circuits, 1980