External Compensation of Nonuniform Electrical Characteristics of Thin-Film Transistors and Degradation of OLED Devices in AMOLED Displays
Authors:
- 6 March 2009
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 30 (4) , 377-379
Abstract
The variation of electrical characteristics of polycrystalline-silicon thin-film transistor (TFT) and degradation of organic light-emitting-diode (OLED) device cause nonuniform intensity of luminance and image sticking in active-matrix OLED (AMOLED) displays. An external compensation method that senses and compensates variations of threshold voltage and mobility of TFTs and degradation of OLED device is proposed. The effect of the external compensation method on AMOLED pixel is experimentally verified by measuring the luminance of OLEDs and the electrical characteristics of TFTs in AMOLED pixels.Keywords
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