The Impact of PZT Seed Layer on Microstructure, Dielectric and Ferroelectric Properties of 0.93PMN-0.07PT Thin Films
Authors:
- 29 October 2010
- journal article
- research article
- Published by Taylor & Francis in Ferroelectrics
- Vol. 405 (1) , 275-280
Abstract
This paper investigated the effect of PZT30/70 seed layer as a nucleation aid on the microstructure and electrical properties of 0.93PMN-0.07PT thin films. Pyrochlore phase was totally eliminated at an annealing temperature as low as 650°C. Seeded 0.93PMN-0.07PT thin film possessed a denser structure, larger grain size, and thus higher permittivity, spontaneous polarization and pyrocoefficient than unseeded film. The slim P-E loops and the frequency dependent T m observed in both films indicated a relaxor-like behavior.Keywords
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