Scanning reflection electron micrographs of stacking faults in a Co-4wt% Ti alloy
Authors:
- D. C. JoyDJD. C. Joy
- G. R. BookerGBG. R. Booker
- 16 January 1974
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 21 (1) , K1-K5
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Dislocation images in the high resolution scanning electron microscopePhilosophical Magazine, 1972
- A dynamical theory for the contrast of perfect and imperfect crystals in the scanning electron microscope using backscattered electronsPhilosophical Magazine, 1972
- Calculations of lattice defect images for scanning electron microscopyPhilosophical Magazine, 1971
- Observation of crystal defects using the scanning electron microscopePhilosophical Magazine, 1971
- On the determination of the nature of stacking faults in F.C.C. metals from the bright field imagePhysica Status Solidi (b), 1966
- Anomalous electron absorption effects in metal foils: theory and comparison with experimentProceedings of the Royal Society of London. A. Mathematical and Physical Sciences, 1962