Zero Defect and Zero Waste Digitalization: A Secure Data Exchange Framework for Non-destructive Inspection Solutions
Authors:
- Joan LarioJLJoan Lario
- Marcos TerolMTMarcos Terol
- Javier MateosJMJavier Mateos
- Noel TomasNTNoel Tomas
- 3 February 2026
- book chapter
- Published by Springer Nature
- p. 48-53
Abstract
No abstract availableKeywords
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