Lifetime prediction model of electrophoretic display based on high temperature and high humidity test

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Abstract
This paper studied the failure model of electrophoretic display (EPD) under different temperature and humidity conditions. With nine high temperature and high humidity tests, it verified that the Arrhenius accelerated lifetime model and the Peck accelerated lifetime model were not suitable for the lifetime prediction of EPD. Therefore, based on these two accelerated life models, this article proposed a new acceleration lifetime model, the Luo, Wu and Wu (LWW) model, which was more suitable for EPDs.
Funding Information
  • Research and Industrialization of Key Technologies for Flexible Organic TFT and Flexible Electrophoretic Display ((CXLJTD-201605))

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