Influence of ion bombardment on depth resolution in Auger electron spectroscopy analysis of thin gold films on nickel
Authors:
- H.J. MathieuHMH.J. Mathieu
- D.E. McClureDMD.E. McClure
- D. LandoltDLD. Landolt
- 1 November 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 38 (3) , 281-294
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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