Analog test design with I/sub DD/ measurements for the detection of parametric and catastrophic faults
Authors:
- 27 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 822-827
Abstract
Earlier approaches dealt with the detection of catastrophic faults based on I/sub DD/ monitoring. Consideration of the more subtle parametric faults and the ADC quantization noise, however, is essential for high-quality analog testing. The paper presents a new design method for analog test of parametric and catastrophic faults by I/sub DD/ monitoring. ADC quantization noise is systematically considered throughout the method. Results prove its effectiveness.Keywords
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