Interpretation of photocurrent transients at semiconductor electrodes: Effects of band-edge unpinning
Authors:
- Laurence M. PeterLPLaurence M. Peter
- Alison B. WalkerAWAlison B. Walker
- Thomas BeinTBThomas Bein
- Alexander G. HufnagelAHAlexander G. Hufnagel
- Ilina KondoferskyIKIlina Kondofersky
Top Cited Papers
- 1 September 2020
- journal article
- research article
- Published by Elsevier in Journal of Electroanalytical Chemistry
- Vol. 872
Abstract
No abstract availableKeywords
Funding Information
- European Commission
This publication has 30 references indexed in Scilit:
- Charge carrier trapping, recombination and transfer in hematite (α-Fe2O3) water splitting photoanodesChemical Science, 2013
- Fabrication of nanostructured α-Fe2O3 electrodes using ferrocene for solar hydrogen generationMaterials Letters, 2009
- Microwave Reflectance Studies of Photoelectrochemical Kinetics at Semiconductor Electrodes. 2. Hydrogen Evolution at p-Si in Ammonium Fluoride SolutionThe Journal of Physical Chemistry B, 2003
- Microwave Reflectance Studies of Photoelectrochemical Kinetics at Semiconductor Electrodes. 1. Steady-State, Transient, and Periodic ResponsesThe Journal of Physical Chemistry B, 2003
- The Mechanism of Hydrogen Gas Evolution on GaAs Cathodes Elucidated by In Situ Infrared SpectroscopyThe Journal of Physical Chemistry B, 1999
- A Study of the Photoanodic Dissolution of CdS with Electrical and Opto‐electrical Impedance SpectroscopyJournal of the Electrochemical Society, 1992
- Dynamic aspects of semiconductor photoelectrochemistryChemical Reviews, 1990
- Calculation of the electrical impedance associated with the surface recombination of free carriers at an illuminated semiconductor/electrolyte interfaceJournal of Physics D: Applied Physics, 1986
- Band‐Edge Shift and Surface Charges at Illuminated n ‐ GaAs / Aqueous Electrolyte Junctions: Surface‐State Analysis and Simulation of Their Occupation RateJournal of the Electrochemical Society, 1985
- Electrochemical Photocapacitance Spectroscopy Method for Characterization of Deep Levels and Interface States in Semiconductor MaterialsJournal of the Electrochemical Society, 1984