Atomistic simulation of structural phase transformations in monocrystalline silicon induced by nanoindentation
Authors:
- D E KimDKD E Kim
- S I OhSOS I Oh
- 7 April 2006
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 17 (9) , 2259-2265
Abstract
No abstract availableThis publication has 33 references indexed in Scilit:
- Examining pressure-induced phase transformations in silicon by spherical indentation and Raman spectroscopy: A statistical studyJournal of Materials Research, 2004
- High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentationJournal of Applied Physics, 2003
- In situelectrical characterization of phase transformations in Si during indentationPhysical Review B, 2003
- Contact resistance and phase transformations during nanoindentation of siliconPhilosophical Magazine A, 2002
- Mechanical deformation in silicon by micro-indentationJournal of Materials Research, 2001
- Raman microspectroscopy of nanocrystalline and amorphous phases in hardness indentationsJournal of Raman Spectroscopy, 1999
- Phase transformations of silicon caused by contact loadingJournal of Applied Physics, 1997
- The deformation behavior of ceramic crystals subjected to very low load (nano)indentationsJournal of Materials Research, 1992
- Amorphization and Conductivity of Silicon and Germanium Induced by IndentationPhysical Review Letters, 1988
- Static compression of silicon in the [100] and in the [111] directionsJournal of Applied Physics, 1980