Microanalytical investigation of sintered SiC
Authors:
- 1 October 1983
- journal article
- research article
- Published by Springer Nature in Journal of Materials Science
- Vol. 18 (10) , 3154-3160
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Microanalytical investigation of sintered SiCJournal of Materials Science, 1983
- Grain-boundary segregation in aluminium-doped silicon carbideJournal of Materials Science, 1982
- An application of EELS in the examination of inclusions and grain boundaries of a SiC ceramicJournal of Microscopy, 1981
- Boron Transport and Change of Lattice Parameter During Sintering of β‐SiCJournal of the American Ceramic Society, 1980
- Sputtering process of a silicon carbide surface with energetic ions by means of an AES-SIMS-FDS combined systemJournal of Nuclear Materials, 1978