Reliability studies for the White Rabbit Switch in KM3NeT: FIDES and Highly Accelerated Life Tests

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Abstract
Two neutrino telescopes are being installed in the Mediterranean Sea by the KM3NeT Collaboration. The Collaboration is currently validating the viability of the standard White Rabbit technology for the next phase of the project. One of the necessary studies for this validation is the reliability assessment of the Switching Core Board and its carrier, the main electronics components of the White Rabbit Switch. This contribution presents the reliability studies, based on the FIDES method, performed to the Switch Core Board and the KM3NeT carrier in order to obtain an estimate of the Failure In Time, as well as to find which components can be optimised in order to increase the reliability of the system. Moreover, the Highly Accelerated Life Tests, a stress testing methodology for enhancing product reliability, performed to the first prototypes of the switch electronics boards, produced with the FIDES modifications, are presented.

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