Micro gratings written in ZnO:Al thin films using picosecond UV‐laser interference patterning
- 1 July 2013
- journal article
- rrl solar
- Published by Wiley in Physica Status Solidi (RRL) – Rapid Research Letters
- Vol. 7 (9) , 635-638
Abstract
Diffraction micro gratings have been written in ZnO:Al thin films using a picosecond laser operating at 355 nm. Micro gratings of 20 µm diameter with a period of 860 nm show a groove depth up to 120 nm. The total transmittance of square‐centimeter‐size grating‐textured ZnO:Al films was almost unchanged after grating formation, while the sheet resistance increased moderately. The textured films reached haze values of 9% at 700 nm. This simple texturing method can be applied also to ZnO:Al films that cannot be texture etched. magnified image Illustration of the interfering laser beams and the resulting micro grating (left) and reflection from a micro grating array written in ZnO:Al on glass (right).Keywords
Funding Information
- Bundesministerium für Forschung, Technologie und Raumfahrt (00325299)
This publication has 18 references indexed in Scilit:
- Ultrafast laser direct hard-mask writing for high efficiency c-Si texture designsEPJ Photovoltaics, 2013
- Efficiency Enhancement of Organic Solar Cells by Fabricating Periodic Surface Textures using Direct Laser Interference PatterningAdvanced Materials, 2012
- 2D Periodic Gratings by Laser ProcessingEnergy Procedia, 2012
- Properties of ultrafast laser textured silicon for photovoltaicsSolar Energy Materials and Solar Cells, 2011
- Pulse duration impact on laser structured ZnO:AlPhysica Status Solidi (RRL) – Rapid Research Letters, 2011
- Generation of Periodic Micro- and Nano-structures by Parameter-Controlled Three-beam Laser Interference TechniqueJournal of Laser Micro/Nanoengineering, 2011
- Large Area Direct Fabrication of periodic Arrays using Interference PatterningPhysics Procedia, 2011
- Direct Fabrication of Periodic Structures on SurfacesPhotonicsViews, 2010
- Direct micro-patterning of aluminum substrates via laser interference metallurgyApplied Surface Science, 2008
- Texture Morphology of SnO2:F Films and Cell ReflectanceJapanese Journal of Applied Physics, 1988