Maintenance and dissemination of voltage standards by Zener-diode-based instruments
Author:
- 4 November 2002
- journal article
- Published by Institution of Engineering and Technology (IET) in IEE Proceedings - Science, Measurement and Technology
- Vol. 149 (6) , 305-312
Abstract
Although arrays of Josephson junctions are today's primary reference standards of voltage, they are used by only 30 to 40 national metrology institutes around the world and perhaps a comparable number of primary metrology laboratories. Nearly all traceable voltage measurements are linked to Josephson standards by chains containing electronic DC voltage standards referenced to Zener diodes. These typically take the form of small, rather easily transportable instruments that provide outputs of 10 V and 1.018 V. The specified stability over a 1-year period of the 10 V outputs of the best Zener standards is quite good, of the order of one part in 106 of the nominal output voltage, and, by modelling temporal drift and correcting for environmental influences, output voltages can be predictable, over periods of several weeks or more, to within a few parts in 108. However, given that the demonstrated reproducibility of 10 V Josephson standards is of the order of a few parts in 1010 of the nominal output, an enormous increase in measurement uncertainty occurs in going from Josephson standards to Zeners. The various effects that limit the reproducibility of Zener standards, including drift, pressure, temperature and humidity effects and, ultimately, 1/f noise, are reviewed.Keywords
This publication has 11 references indexed in Scilit:
- Complete characterization of Zener standards at 10 V for measurement assurance program (MAP)IEEE Transactions on Instrumentation and Measurement, 2001
- Recent developments in BIPM voltage standard comparisonsIEEE Transactions on Instrumentation and Measurement, 2001
- Interlaboratory comparison of Josephson voltage standardsIEEE Transactions on Instrumentation and Measurement, 2001
- Determination of the pressure coefficientsof electronic voltage standardsIEE Proceedings - Science, Measurement and Technology, 2000
- Using power spectra and Allan variancesto characterisethe noise of Zener-diode voltage standardsIEE Proceedings - Science, Measurement and Technology, 2000
- TESTING FOR CORRELATIONS IN MEASUREMENTS2000
- Pressure coefficients of some Zener diode-based electronic voltage standardsIEEE Transactions on Instrumentation and Measurement, 1999
- Measurements of the temperature dependenceof the output voltages of someZener diode based voltage standardsIEE Proceedings - Science, Measurement and Technology, 1998
- Low-frequency spectral analysis of DC nanovoltmeters and voltage reference standardsIEEE Transactions on Instrumentation and Measurement, 1997
- The stability of some Zener-diode-based voltage standardsIEEE Transactions on Instrumentation and Measurement, 1995