The role of Si incorporation on the anodic growth of barrier-type Al oxide
Authors:
- C. CancellieriC. Cancellieri
- F. EvangelistiFEF. Evangelisti
- T. GeldmacherTGT. Geldmacher
- V. Araullo-PetersVAV. Araullo-Peters
- N. OttN. Ott
- M. ChiodiMCM. Chiodi
- M. DöbeliMDM. Döbeli
- P. SchmutzP. Schmutz
- 1 December 2017
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 226, 120-131
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
- Stability of ultra-thin oxide overgrowths on binary Al–Si alloy substrateJournal of Materials Science, 2016
- Electromechanical Breakdown of Barrier-Type Anodized Aluminum Oxide Thin Films Under High Electric Field ConditionsJournal of Electronic Materials, 2015
- Characterization of dynamic material properties of light alloys for crashworthiness applicationsMaterials Research, 2010
- Applications of Powder Metallurgy Aluminums for Automotive Valve-TrainsSAE International Journal of Materials and Manufacturing, 2008
- Capacitors: operating principles, current market and technical trendsJournal of Power Sources, 1996
- Preparation of microporous metal membranes by two-step replication of the microstructure of anodic aluminaThin Solid Films, 1993
- Magnesium diffusion, surface segregation and oxidation in Al-Mg alloysJournal of Materials Science, 1984
- The Al-Si (Aluminum-Silicon) systemBulletin of Alloy Phase Diagrams, 1984
- Mechanical properties of cast light alloysMetal Science and Heat Treatment, 1969
- Anodic oxide films on aluminumChemical Reviews, 1969