Influence of the area of a thermal pad on optical and thermal parameters of LED modules
Authors:
- 9 March 2020
- journal article
- research article
- Published by Emerald Publishing in Circuit World
- Vol. 46 (2) , 65-70
Abstract
Purpose: The purpose of this paper is to present and discuss the results of measurements illustrating influence of the area of a thermal pad and the kind of the used base on thermal and optical parameters of LED modules. Design/methodology/approach: LED modules including six power LEDs are designed. In the layout of these modules, different areas of a thermal pad of each LED are used. These modules are made using the classical FR-4 base and metal core printed circuit board (MCPCB). Thermal and optical parameters of all the tested modules are measured using the method elaborated by the authors. Findings: The obtained results of measurements prove that increasing the area of a thermal pad causes a decrease in thermal resistance of the tested LED modules and an increase in power density of the emitted light. The role of the area of a thermal pad is more important for the classical FR-4 base than for MCPCB. Research limitations/implications: Investigations were performed for only two values of the area of thermal pads and selected values of LEDs forward current. Originality/value: The presented results of investigations show how the used layout and type of the used base of these modules influence optical and thermal parameters of LED modules. Changing the base of a module can cause even a double decrease in thermal resistance and a double increase in power density of the emitted light.Keywords
This publication has 19 references indexed in Scilit:
- Study on the methods to measure the junction-to-case thermal resistance of IGBT modules and press pack IGBTsMicroelectronics Reliability, 2017
- Modelling LED lamps in SPICE with thermal phenomena taken into accountMicroelectronics Reliability, 2017
- Simulation of LED based luminaires by using multi-domain compact models of LEDs and compact thermal models of their thermal environmentMicroelectronics Reliability, 2017
- A Bipolar-Pulse Voltage Method for Junction Temperature Measurement of Alternating Current Light-Emitting DiodesIEEE Transactions on Electron Devices, 2017
- X-ray inspection and Six-Sigma in analysis of LED thermal pad coverageSoldering & Surface Mount Technology, 2017
- Multi-domain compact modeling of LEDs: An overview of models and experimental dataMicroelectronics Journal, 2015
- Optimum design domain of LED-based solid state lighting considering cost, energy consumption and reliabilityMicroelectronics Reliability, 2013
- Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters—A ReviewIEEE Transactions on Power Electronics, 2012
- Light emitting diodes reliability reviewMicroelectronics Reliability, 2012
- Driving the 21st century's lightsIEEE Spectrum, 2012